Since Nov 1982 working at the Spanish Centre of Metrology.
Since Nov 1994, Head of the Length Technical Area.
Spanish Representative at the EURAMET Technical Committee on Length.
Member of the Consultative Committees for Length (CCL) and Units (CCU), of the International Committee of Weights and Measures (CIPM).
Member of the International Society for Optical Engineering (SPIE)
Member of the Scientific Committee of NanoSpain
Member ot the Technical Committee CT3 Dimensional Metrology of ENAC, the Spanish Accreditation Body.
Member of the Sub-Committee CTN82/SC2 Dimensional Metrology of AENOR, the Spanish Standardization Body.
Chairman of the Group AENOR GET15 Standardi...