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Budapest Hungary
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Electronics / Computer Hardware
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Presentations(11)Ìý

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Evaluation of Radiation-Induced Soft Error in Majority Voters Designed in 7nm FinFET Technology
Evaluation of Radiation-Induced Soft Error in Majority Voters Designed in 7nm FinFET TechnologyEvaluation of Radiation-Induced Soft Error in Majority Voters Designed in 7nm FinFET Technology
Evaluation of Radiation-Induced Soft Error in Majority Voters Designed in 7nm FinFET Technology
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Exploiting fault model correlations to accelerate seu sensitivity assessmentExploiting fault model correlations to accelerate seu sensitivity assessment
Exploiting fault model correlations to accelerate seu sensitivity assessment
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Reliability Evaluation of Combinational Circuits from a Standard Cell Library
Reliability Evaluation of Combinational Circuits from a Standard Cell LibraryReliability Evaluation of Combinational Circuits from a Standard Cell Library
Reliability Evaluation of Combinational Circuits from a Standard Cell Library
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Documents(6)Ìý

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Design Robustness Evaluation for Permanent and Single Event Transient
Design Robustness Evaluation for Permanent and Single Event TransientDesign Robustness Evaluation for Permanent and Single Event Transient
Design Robustness Evaluation for Permanent and Single Event Transient
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Relatório da Simulação de modelo Eletromecânico – Motor CCRelatório da Simulação de modelo Eletromecânico – Motor CC
Relatório da Simulação de modelo Eletromecânico – Motor CC
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Análise da resposta natural e a um degrau de um circuito RL e RC utilizando PSPICEAnálise da resposta natural e a um degrau de um circuito RL e RC utilizando PSPICE
Análise da resposta natural e a um degrau de um circuito RL e RC utilizando PSPICE
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