5+ years of experience in semiconductor test program development on ATE for SOCs and NAND Flash memory.
Skills -
ATE : Advantest 93k, Verigy 5400 and C1D (memory testers),
Programming Languages : C , C++, Perl , C#(1 yr exp) ,
Data analysis tools : JMP, data power , optimal+.
Good knowledge of semiconductor SOC testing techniques, structural and functional tests. Worked on NAND flash 2D , 3D device characterization , functional and reliability test development.