�ݺ�ߣshows by User: HPERERA

�ݺ�ߣshows by User: HPERERA / http://www.slideshare.net/images/logo.gif �ݺ�ߣshows by User: HPERERA / Mon, 30 Jan 2017 17:44:49 GMT �ݺ�ߣShare feed for �ݺ�ߣshows by User: HPERERA ESS and HASS: Concerns with the Practices and Standards /slideshow/ess-and-hass-concerns-with-the-practices-and-standards/71552132 essandhassconcernswithstandards-170130174449
The purpose of "stress" screening such as environmental stress screening (ESS) or highly accelerated stress screening (HASS) is to precipitate failures in weak or defective populations using some load (stress) condition(s) without reducing the required useful life of the product]]>
The purpose of "stress" screening such as environmental stress screening (ESS) or highly accelerated stress screening (HASS) is to precipitate failures in weak or defective populations using some load (stress) condition(s) without reducing the required useful life of the product]]> Mon, 30 Jan 2017 17:44:49 GMT /slideshow/ess-and-hass-concerns-with-the-practices-and-standards/71552132 HPERERA@slideshare.net(HPERERA) ESS and HASS: Concerns with the Practices and Standards HPERERA The purpose of "stress" screening such as environmental stress screening (ESS) or highly accelerated stress screening (HASS) is to precipitate failures in weak or defective populations using some load (stress) condition(s) without reducing the required useful life of the product <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/essandhassconcernswithstandards-170130174449-thumbnail.jpg?width=120&height=120&fit=bounds" /> The purpose of "stress" screening such as environmental stress screening (ESS) or highly accelerated stress screening (HASS) is to precipitate failures in weak or defective populations using some load (stress) condition(s) without reducing the required useful life of the product

ESS and HASS: Concerns with the Practices and Standards from Hilaire (Ananda) Perera P.Eng.

]]> 3170 9 https://cdn.slidesharecdn.com/ss_thumbnails/essandhassconcernswithstandards-170130174449-thumbnail.jpg?width=120&height=120&fit=bounds presentation Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 CALCE Test Services and Failure Analysis (TSFA) Laboratory /slideshow/calce-test-services-and-failure-analysis-tsfa-laboratory/67739362 calceandtsfa-161027162432
The TSFA Lab performs standard and custom tests and failure analysis services, including proprietary services that may range from a day to service year.]]>
The TSFA Lab performs standard and custom tests and failure analysis services, including proprietary services that may range from a day to service year.]]> Thu, 27 Oct 2016 16:24:32 GMT /slideshow/calce-test-services-and-failure-analysis-tsfa-laboratory/67739362 HPERERA@slideshare.net(HPERERA) CALCE Test Services and Failure Analysis (TSFA) Laboratory HPERERA The TSFA Lab performs standard and custom tests and failure analysis services, including proprietary services that may range from a day to service year. <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/calceandtsfa-161027162432-thumbnail.jpg?width=120&height=120&fit=bounds" /> The TSFA Lab performs standard and custom tests and failure analysis services, including proprietary services that may range from a day to service year.

CALCE Test Services and Failure Analysis (TSFA) Laboratory from Hilaire (Ananda) Perera P.Eng.

]]> 202 6 https://cdn.slidesharecdn.com/ss_thumbnails/calceandtsfa-161027162432-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 IEEE 1633 Recommended Practice on Software Reliability /slideshow/ieee-1633-recommended-practice-on-software-reliability/67246820 ieee1633recommendedpracticeonsoftwarereliability-161016162150
Software reliability engineering has existed for over 50 years, fundamental prerequisite for virtually all modern systems. Diverse set of stakeholders requires pragmatic guidance and tools to apply software reliability models to assess real software or firmware projects during each stage of the software development lifecycle. Reliability engineers may lack software development experience. Software engineers may be unfamiliar with methods to predict software reliability. Both may have challenges acquiring data needed for the analyses. Newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses. ]]>
Software reliability engineering has existed for over 50 years, fundamental prerequisite for virtually all modern systems. Diverse set of stakeholders requires pragmatic guidance and tools to apply software reliability models to assess real software or firmware projects during each stage of the software development lifecycle. Reliability engineers may lack software development experience. Software engineers may be unfamiliar with methods to predict software reliability. Both may have challenges acquiring data needed for the analyses. Newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses. ]]> Sun, 16 Oct 2016 16:21:50 GMT /slideshow/ieee-1633-recommended-practice-on-software-reliability/67246820 HPERERA@slideshare.net(HPERERA) IEEE 1633 Recommended Practice on Software Reliability HPERERA Software reliability engineering has existed for over 50 years, fundamental prerequisite for virtually all modern systems. Diverse set of stakeholders requires pragmatic guidance and tools to apply software reliability models to assess real software or firmware projects during each stage of the software development lifecycle. Reliability engineers may lack software development experience. Software engineers may be unfamiliar with methods to predict software reliability. Both may have challenges acquiring data needed for the analyses. Newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses. <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/ieee1633recommendedpracticeonsoftwarereliability-161016162150-thumbnail.jpg?width=120&height=120&fit=bounds" /> Software reliability engineering has existed for over 50 years, fundamental prerequisite for virtually all modern systems. Diverse set of stakeholders requires pragmatic guidance and tools to apply software reliability models to assess real software or firmware projects during each stage of the software development lifecycle. Reliability engineers may lack software development experience. Software engineers may be unfamiliar with methods to predict software reliability. Both may have challenges acquiring data needed for the analyses. Newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses.

IEEE 1633 Recommended Practice on Software Reliability from Hilaire (Ananda) Perera P.Eng.

]]> 523 4 https://cdn.slidesharecdn.com/ss_thumbnails/ieee1633recommendedpracticeonsoftwarereliability-161016162150-thumbnail.jpg?width=120&height=120&fit=bounds presentation Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 BIOMASS Based Power ( Electrical & Thermal ) /slideshow/biomass-based-power-electrical-thermal/64001450 biomassusedtogenerateelectricityandheat-160713192501
Biomass refers to a group of organic materials that can be used to generate electric and thermal power. Sources of biomass are: herbaceous and woody plants, agriculture and forestry wastes and residues, landfill gases, animal wastes, municipal wastes, and other organic material.]]>
Biomass refers to a group of organic materials that can be used to generate electric and thermal power. Sources of biomass are: herbaceous and woody plants, agriculture and forestry wastes and residues, landfill gases, animal wastes, municipal wastes, and other organic material.]]> Wed, 13 Jul 2016 19:25:01 GMT /slideshow/biomass-based-power-electrical-thermal/64001450 HPERERA@slideshare.net(HPERERA) BIOMASS Based Power ( Electrical & Thermal ) HPERERA Biomass refers to a group of organic materials that can be used to generate electric and thermal power. Sources of biomass are: herbaceous and woody plants, agriculture and forestry wastes and residues, landfill gases, animal wastes, municipal wastes, and other organic material. <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/biomassusedtogenerateelectricityandheat-160713192501-thumbnail.jpg?width=120&height=120&fit=bounds" /> Biomass refers to a group of organic materials that can be used to generate electric and thermal power. Sources of biomass are: herbaceous and woody plants, agriculture and forestry wastes and residues, landfill gases, animal wastes, municipal wastes, and other organic material.

BIOMASS Based Power ( Electrical & Thermal ) from Hilaire (Ananda) Perera P.Eng.

]]> 458 5 https://cdn.slidesharecdn.com/ss_thumbnails/biomassusedtogenerateelectricityandheat-160713192501-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Reliability Growth Testing (RGT) Plan /slideshow/reliability-growth-testing-rgt-plan/63379516 reliabilitygrowthplan-160623135945
RGT is a planned test-analyze-and-fix (TAAF) process in which End Unit is tested under actual, simulated, or accelerated environments to disclose design deficiencies and defects. It is intended to provide a basis for early incorporation of corrective actions and for verification of their effectiveness, thus promoting reliability growth. RGT is intended to correct failures that reduce operational effectiveness and failures that increase maintenance and logistics support costs.]]>
RGT is a planned test-analyze-and-fix (TAAF) process in which End Unit is tested under actual, simulated, or accelerated environments to disclose design deficiencies and defects. It is intended to provide a basis for early incorporation of corrective actions and for verification of their effectiveness, thus promoting reliability growth. RGT is intended to correct failures that reduce operational effectiveness and failures that increase maintenance and logistics support costs.]]> Thu, 23 Jun 2016 13:59:45 GMT /slideshow/reliability-growth-testing-rgt-plan/63379516 HPERERA@slideshare.net(HPERERA) Reliability Growth Testing (RGT) Plan HPERERA RGT is a planned test-analyze-and-fix (TAAF) process in which End Unit is tested under actual, simulated, or accelerated environments to disclose design deficiencies and defects. It is intended to provide a basis for early incorporation of corrective actions and for verification of their effectiveness, thus promoting reliability growth. RGT is intended to correct failures that reduce operational effectiveness and failures that increase maintenance and logistics support costs. <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/reliabilitygrowthplan-160623135945-thumbnail.jpg?width=120&height=120&fit=bounds" /> RGT is a planned test-analyze-and-fix (TAAF) process in which End Unit is tested under actual, simulated, or accelerated environments to disclose design deficiencies and defects. It is intended to provide a basis for early incorporation of corrective actions and for verification of their effectiveness, thus promoting reliability growth. RGT is intended to correct failures that reduce operational effectiveness and failures that increase maintenance and logistics support costs.

Reliability Growth Testing (RGT) Plan from Hilaire (Ananda) Perera P.Eng.

]]> 1712 12 https://cdn.slidesharecdn.com/ss_thumbnails/reliabilitygrowthplan-160623135945-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Statistical Confidence Level /slideshow/statistical-confidence-level/61479536 statisticalconfidencelevel-160428202656
The statistical Confidence Level (C.L.) is the probability that the corresponding confidence interval covers the true ( but unknown ) value of a population parameter. Such confidence interval is often used as a measure of uncertainty about estimates of population parameters ]]>
The statistical Confidence Level (C.L.) is the probability that the corresponding confidence interval covers the true ( but unknown ) value of a population parameter. Such confidence interval is often used as a measure of uncertainty about estimates of population parameters ]]> Thu, 28 Apr 2016 20:26:56 GMT /slideshow/statistical-confidence-level/61479536 HPERERA@slideshare.net(HPERERA) Statistical Confidence Level HPERERA The statistical Confidence Level (C.L.) is the probability that the corresponding confidence interval covers the true ( but unknown ) value of a population parameter. Such confidence interval is often used as a measure of uncertainty about estimates of population parameters <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/statisticalconfidencelevel-160428202656-thumbnail.jpg?width=120&height=120&fit=bounds" /> The statistical Confidence Level (C.L.) is the probability that the corresponding confidence interval covers the true ( but unknown ) value of a population parameter. Such confidence interval is often used as a measure of uncertainty about estimates of population parameters

Statistical Confidence Level from Hilaire (Ananda) Perera P.Eng.

]]> 1541 6 https://cdn.slidesharecdn.com/ss_thumbnails/statisticalconfidencelevel-160428202656-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Reliability if "m" of "n" Must be Working /slideshow/reliability-if-m-of-n-must-be-working/57343968 mofn-160121203114
A "m" out of "n" system is a system with "n" components which function if and only if "m" or more of the components function]]>
A "m" out of "n" system is a system with "n" components which function if and only if "m" or more of the components function]]> Thu, 21 Jan 2016 20:31:14 GMT /slideshow/reliability-if-m-of-n-must-be-working/57343968 HPERERA@slideshare.net(HPERERA) Reliability if "m" of "n" Must be Working HPERERA A "m" out of "n" system is a system with "n" components which function if and only if "m" or more of the components function <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/mofn-160121203114-thumbnail.jpg?width=120&height=120&fit=bounds" /> A "m" out of "n" system is a system with "n" components which function if and only if "m" or more of the components function

Reliability if "m" of "n" Must be Working from Hilaire (Ananda) Perera P.Eng.

]]> 298 5 https://cdn.slidesharecdn.com/ss_thumbnails/mofn-160121203114-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Outgoing Reliability Assurance of 'End-Units' /slideshow/outgoing-reliability-assurance-of-endunits/53984070 outgoing1reliabilityassuranceofendunits-151015164214-lva1-app6892
Environmental Stress Screening (ESS) is performed on most of the Electrical/Electronic products. However Failure Rate/Time distribution analysis is not conducted always to evaluate the effectiveness of the Screening Process]]>
Environmental Stress Screening (ESS) is performed on most of the Electrical/Electronic products. However Failure Rate/Time distribution analysis is not conducted always to evaluate the effectiveness of the Screening Process]]> Thu, 15 Oct 2015 16:42:14 GMT /slideshow/outgoing-reliability-assurance-of-endunits/53984070 HPERERA@slideshare.net(HPERERA) Outgoing Reliability Assurance of 'End-Units' HPERERA Environmental Stress Screening (ESS) is performed on most of the Electrical/Electronic products. However Failure Rate/Time distribution analysis is not conducted always to evaluate the effectiveness of the Screening Process <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/outgoing1reliabilityassuranceofendunits-151015164214-lva1-app6892-thumbnail.jpg?width=120&height=120&fit=bounds" /> Environmental Stress Screening (ESS) is performed on most of the Electrical/Electronic products. However Failure Rate/Time distribution analysis is not conducted always to evaluate the effectiveness of the Screening Process

Outgoing Reliability Assurance of 'End-Units' from Hilaire (Ananda) Perera P.Eng.

]]> 386 4 https://cdn.slidesharecdn.com/ss_thumbnails/outgoing1reliabilityassuranceofendunits-151015164214-lva1-app6892-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Transient Suppressors /slideshow/transient-suppressors/51693178 transientsuppressors-150816170546-lva1-app6891
Transients can cause slow degradation, erratic operation, or catastrophic failure in electrical parts, insulation dielectrics, and electrical contacts used in switches and relays. The possible occurrence of transients must be considered in the overall electronic design. Required circuit performance and reliability must be assured both during and after the transient]]>
Transients can cause slow degradation, erratic operation, or catastrophic failure in electrical parts, insulation dielectrics, and electrical contacts used in switches and relays. The possible occurrence of transients must be considered in the overall electronic design. Required circuit performance and reliability must be assured both during and after the transient]]> Sun, 16 Aug 2015 17:05:46 GMT /slideshow/transient-suppressors/51693178 HPERERA@slideshare.net(HPERERA) Transient Suppressors HPERERA Transients can cause slow degradation, erratic operation, or catastrophic failure in electrical parts, insulation dielectrics, and electrical contacts used in switches and relays. The possible occurrence of transients must be considered in the overall electronic design. Required circuit performance and reliability must be assured both during and after the transient <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/transientsuppressors-150816170546-lva1-app6891-thumbnail.jpg?width=120&height=120&fit=bounds" /> Transients can cause slow degradation, erratic operation, or catastrophic failure in electrical parts, insulation dielectrics, and electrical contacts used in switches and relays. The possible occurrence of transients must be considered in the overall electronic design. Required circuit performance and reliability must be assured both during and after the transient

Transient Suppressors from Hilaire (Ananda) Perera P.Eng.

]]> 910 4 https://cdn.slidesharecdn.com/ss_thumbnails/transientsuppressors-150816170546-lva1-app6891-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Reliability Prediction Procedure for Mechanical Components /HPERERA/reliability-prediction-procedure-for-mechanical-components mechcomprelpredict-150807201647-lva1-app6892
This document presents methodology to be used to predict mechanical component reliability using the Stress/Strength Interference Method. This method assumes that the material properties are time independent because of their slow change, and the components are not subjected to wear related failure modes]]>
This document presents methodology to be used to predict mechanical component reliability using the Stress/Strength Interference Method. This method assumes that the material properties are time independent because of their slow change, and the components are not subjected to wear related failure modes]]> Fri, 07 Aug 2015 20:16:47 GMT /HPERERA/reliability-prediction-procedure-for-mechanical-components HPERERA@slideshare.net(HPERERA) Reliability Prediction Procedure for Mechanical Components HPERERA This document presents methodology to be used to predict mechanical component reliability using the Stress/Strength Interference Method. This method assumes that the material properties are time independent because of their slow change, and the components are not subjected to wear related failure modes <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/mechcomprelpredict-150807201647-lva1-app6892-thumbnail.jpg?width=120&height=120&fit=bounds" /> This document presents methodology to be used to predict mechanical component reliability using the Stress/Strength Interference Method. This method assumes that the material properties are time independent because of their slow change, and the components are not subjected to wear related failure modes

Reliability Prediction Procedure for Mechanical Components from Hilaire (Ananda) Perera P.Eng.

]]> 643 5 https://cdn.slidesharecdn.com/ss_thumbnails/mechcomprelpredict-150807201647-lva1-app6892-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Software Reliability /slideshow/software-reliability-46662435/46662435 softwarereliability-150405153915-conversion-gate01
Software Reliability models have been in existence since the early 1970, over 200 have been developed. Some of the older models have been discarded based upon more recent information about the assumptions, and newer ones have replaced them.]]>
Software Reliability models have been in existence since the early 1970, over 200 have been developed. Some of the older models have been discarded based upon more recent information about the assumptions, and newer ones have replaced them.]]> Sun, 05 Apr 2015 15:39:14 GMT /slideshow/software-reliability-46662435/46662435 HPERERA@slideshare.net(HPERERA) Software Reliability HPERERA Software Reliability models have been in existence since the early 1970, over 200 have been developed. Some of the older models have been discarded based upon more recent information about the assumptions, and newer ones have replaced them. <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/softwarereliability-150405153915-conversion-gate01-thumbnail.jpg?width=120&height=120&fit=bounds" /> Software Reliability models have been in existence since the early 1970, over 200 have been developed. Some of the older models have been discarded based upon more recent information about the assumptions, and newer ones have replaced them.

Software Reliability from Hilaire (Ananda) Perera P.Eng.

]]> 644 1 https://cdn.slidesharecdn.com/ss_thumbnails/softwarereliability-150405153915-conversion-gate01-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Virtual Qualification /slideshow/virtual-qual-flowchart/46100293 virtualqualflowchart-150320183945-conversion-gate01
Virtual qualification is the first stage of the overall qualification process. It is the application of Physics of Failure (PoF) based reliability assessment to determine if a proposed product can survive its anticipated life cycle]]>
Virtual qualification is the first stage of the overall qualification process. It is the application of Physics of Failure (PoF) based reliability assessment to determine if a proposed product can survive its anticipated life cycle]]> Fri, 20 Mar 2015 18:39:45 GMT /slideshow/virtual-qual-flowchart/46100293 HPERERA@slideshare.net(HPERERA) Virtual Qualification HPERERA Virtual qualification is the first stage of the overall qualification process. It is the application of Physics of Failure (PoF) based reliability assessment to determine if a proposed product can survive its anticipated life cycle <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/virtualqualflowchart-150320183945-conversion-gate01-thumbnail.jpg?width=120&height=120&fit=bounds" /> Virtual qualification is the first stage of the overall qualification process. It is the application of Physics of Failure (PoF) based reliability assessment to determine if a proposed product can survive its anticipated life cycle

Virtual Qualification from Hilaire (Ananda) Perera P.Eng.

]]> 421 1 https://cdn.slidesharecdn.com/ss_thumbnails/virtualqualflowchart-150320183945-conversion-gate01-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Availability /slideshow/availability-types/41016470 availabilitytypes-141102084127-conversion-gate02
Availability is a performance criterion for repairable systems that accounts for both the reliability and maintainability properties of a component or system. It is defined as the probability that the system is operating properly when it is requested for use]]>
Availability is a performance criterion for repairable systems that accounts for both the reliability and maintainability properties of a component or system. It is defined as the probability that the system is operating properly when it is requested for use]]> Sun, 02 Nov 2014 08:41:26 GMT /slideshow/availability-types/41016470 HPERERA@slideshare.net(HPERERA) Availability HPERERA Availability is a performance criterion for repairable systems that accounts for both the reliability and maintainability properties of a component or system. It is defined as the probability that the system is operating properly when it is requested for use <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/availabilitytypes-141102084127-conversion-gate02-thumbnail.jpg?width=120&height=120&fit=bounds" /> Availability is a performance criterion for repairable systems that accounts for both the reliability and maintainability properties of a component or system. It is defined as the probability that the system is operating properly when it is requested for use

Availability from Hilaire (Ananda) Perera P.Eng.

]]> 1386 5 https://cdn.slidesharecdn.com/ss_thumbnails/availabilitytypes-141102084127-conversion-gate02-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Testability /slideshow/testability-40742024/40742024 testability-141026151123-conversion-gate02
Testability refers to the design parameter which makes it relatively easy to identify and isolate faults in the system. Testability can be considered to be a subset of maintainability, because fault detection and isolation are important drivers in the maintainability of a system]]>
Testability refers to the design parameter which makes it relatively easy to identify and isolate faults in the system. Testability can be considered to be a subset of maintainability, because fault detection and isolation are important drivers in the maintainability of a system]]> Sun, 26 Oct 2014 15:11:23 GMT /slideshow/testability-40742024/40742024 HPERERA@slideshare.net(HPERERA) Testability HPERERA Testability refers to the design parameter which makes it relatively easy to identify and isolate faults in the system. Testability can be considered to be a subset of maintainability, because fault detection and isolation are important drivers in the maintainability of a system <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/testability-141026151123-conversion-gate02-thumbnail.jpg?width=120&height=120&fit=bounds" /> Testability refers to the design parameter which makes it relatively easy to identify and isolate faults in the system. Testability can be considered to be a subset of maintainability, because fault detection and isolation are important drivers in the maintainability of a system

Testability from Hilaire (Ananda) Perera P.Eng.

]]> 396 3 https://cdn.slidesharecdn.com/ss_thumbnails/testability-141026151123-conversion-gate02-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Accelerated Stress Testing /slideshow/accelerated-stress-testing/38534093 acceleratedstresstesting-140831101006-phpapp02
This handbook is written to show how greater control can be gained over total product reliability by the utilization of Accelerated Stress Testing techniques (AST)]]>
This handbook is written to show how greater control can be gained over total product reliability by the utilization of Accelerated Stress Testing techniques (AST)]]> Sun, 31 Aug 2014 10:10:06 GMT /slideshow/accelerated-stress-testing/38534093 HPERERA@slideshare.net(HPERERA) Accelerated Stress Testing HPERERA This handbook is written to show how greater control can be gained over total product reliability by the utilization of Accelerated Stress Testing techniques (AST) <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/acceleratedstresstesting-140831101006-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds" /> This handbook is written to show how greater control can be gained over total product reliability by the utilization of Accelerated Stress Testing techniques (AST)

Accelerated Stress Testing from Hilaire (Ananda) Perera P.Eng.

]]> 1234 10 https://cdn.slidesharecdn.com/ss_thumbnails/acceleratedstresstesting-140831101006-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Early Life Failure Rate Calculation Procedure for Semiconductor Components /slideshow/jesd74-a/38521954 jesd74a-140830161359-phpapp01
This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the Early life Failure Rate meets customers' requirements. ]]>
This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the Early life Failure Rate meets customers' requirements. ]]> Sat, 30 Aug 2014 16:13:59 GMT /slideshow/jesd74-a/38521954 HPERERA@slideshare.net(HPERERA) Early Life Failure Rate Calculation Procedure for Semiconductor Components HPERERA This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the Early life Failure Rate meets customers' requirements. <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/jesd74a-140830161359-phpapp01-thumbnail.jpg?width=120&height=120&fit=bounds" /> This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates. Projections can be used to compare reliability performance with objectives, provide line feedback, support service cost estimates, and set product test and screen strategies to ensure that the Early life Failure Rate meets customers' requirements.

Early Life Failure Rate Calculation Procedure for Semiconductor Components from Hilaire (Ananda) Perera P.Eng.

]]> 10004 7 https://cdn.slidesharecdn.com/ss_thumbnails/jesd74a-140830161359-phpapp01-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Use of Failure Mechanisms enhance FMEA and FMECA /slideshow/use-of-failure-mechanisms-enhance-fmea-and-fmeca/35873000 useoffailuremechanismsenhancefmeaandfmeca-140614132122-phpapp02
]]>
]]> Sat, 14 Jun 2014 13:21:22 GMT /slideshow/use-of-failure-mechanisms-enhance-fmea-and-fmeca/35873000 HPERERA@slideshare.net(HPERERA) Use of Failure Mechanisms enhance FMEA and FMECA HPERERA <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/useoffailuremechanismsenhancefmeaandfmeca-140614132122-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds" />

Use of Failure Mechanisms enhance FMEA and FMECA from Hilaire (Ananda) Perera P.Eng.

]]> 3616 4 https://cdn.slidesharecdn.com/ss_thumbnails/useoffailuremechanismsenhancefmeaandfmeca-140614132122-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Basic Design Considerations for Surface Mount Technology /slideshow/basic-design-considerations-for-surface-mount-technology/32190241 basicdesignconsiderationsforsurfacemounttechnology-140311145101-phpapp01
]]>
]]> Tue, 11 Mar 2014 14:51:01 GMT /slideshow/basic-design-considerations-for-surface-mount-technology/32190241 HPERERA@slideshare.net(HPERERA) Basic Design Considerations for Surface Mount Technology HPERERA <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/basicdesignconsiderationsforsurfacemounttechnology-140311145101-phpapp01-thumbnail.jpg?width=120&height=120&fit=bounds" />

Basic Design Considerations for Surface Mount Technology from Hilaire (Ananda) Perera P.Eng.

]]> 421 2 https://cdn.slidesharecdn.com/ss_thumbnails/basicdesignconsiderationsforsurfacemounttechnology-140311145101-phpapp01-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Thermal cycling screen development /slideshow/thermal-cycling-screen-development/31178568 thermalcyclingscreendevelopment-140213112927-phpapp02
]]>
]]> Thu, 13 Feb 2014 11:29:27 GMT /slideshow/thermal-cycling-screen-development/31178568 HPERERA@slideshare.net(HPERERA) Thermal cycling screen development HPERERA <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/thermalcyclingscreendevelopment-140213112927-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds" />

Thermal cycling screen development from Hilaire (Ananda) Perera P.Eng.

]]> 1173 6 https://cdn.slidesharecdn.com/ss_thumbnails/thermalcyclingscreendevelopment-140213112927-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds document Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 Design For Reliability /HPERERA/design-for-reliability-30980429 designforreliability1-140208115704-phpapp01
]]>
]]> Sat, 08 Feb 2014 11:57:04 GMT /HPERERA/design-for-reliability-30980429 HPERERA@slideshare.net(HPERERA) Design For Reliability HPERERA <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/designforreliability1-140208115704-phpapp01-thumbnail.jpg?width=120&height=120&fit=bounds" />

Design For Reliability from Hilaire (Ananda) Perera P.Eng.

]]> 5625 8 https://cdn.slidesharecdn.com/ss_thumbnails/designforreliability1-140208115704-phpapp01-thumbnail.jpg?width=120&height=120&fit=bounds presentation Black http://activitystrea.ms/schema/1.0/post

http://activitystrea.ms/schema/1.0/posted

0 https://cdn.slidesharecdn.com/profile-photo-HPERERA-48x48.jpg?cb=1632755930 Design For Six Sigma (DFSS) is successful in achieving higher quality, reducing variation and cutting down the number of non-conforming products. As a Consulting Engineer, promote the fact that Reliability engineers need to be involved in product design using Design For Reliability (DFR) methodology at an early point to identify reliability issues and concerns and begin assessing reliability implications as the design concept emerges. As a Senior Reliability Engineer applied mature engineering knowledge in planning and conducting reliability engineering and related product assurance projects. Emphasized the fact that reliability is the time-based concept of quality and reliability design... https://cdn.slidesharecdn.com/ss_thumbnails/essandhassconcernswithstandards-170130174449-thumbnail.jpg?width=320&height=320&fit=bounds slideshow/ess-and-hass-concerns-with-the-practices-and-standards/71552132 ESS and HASS: Concern... https://cdn.slidesharecdn.com/ss_thumbnails/calceandtsfa-161027162432-thumbnail.jpg?width=320&height=320&fit=bounds slideshow/calce-test-services-and-failure-analysis-tsfa-laboratory/67739362 CALCE Test Services an... https://cdn.slidesharecdn.com/ss_thumbnails/ieee1633recommendedpracticeonsoftwarereliability-161016162150-thumbnail.jpg?width=320&height=320&fit=bounds slideshow/ieee-1633-recommended-practice-on-software-reliability/67246820 IEEE 1633 Recommended ...