際際滷shows by User: cascademicrotech / http://www.slideshare.net/images/logo.gif 際際滷shows by User: cascademicrotech / Wed, 25 Apr 2012 16:09:17 GMT 際際滷Share feed for 際際滷shows by User: cascademicrotech Wafer-Level RF MEMS Devices Characterization in Cryogenic Environment /slideshow/waferlevel-rf-mems-devices-characterization-in-cryogenic-environment/12690930 ets2011-rfmems-120425160919-phpapp02
In the following presentation, we highlight field-proven, relevant test solutions based on a cryogenic wafer-probe station. Special attention is given to overcoming the calibration standards instability, contact repeatability and reliability issues caused by the extreme environmental conditions. We will present the solution that enabled characterizing of RF MEMS devices at cryogenic condition with the benchmarking level of measurement accuracy and confidence.]]>
In the following presentation, we highlight field-proven, relevant test solutions based on a cryogenic wafer-probe station. Special attention is given to overcoming the calibration standards instability, contact repeatability and reliability issues caused by the extreme environmental conditions. We will present the solution that enabled characterizing of RF MEMS devices at cryogenic condition with the benchmarking level of measurement accuracy and confidence.]]> Wed, 25 Apr 2012 16:09:17 GMT /slideshow/waferlevel-rf-mems-devices-characterization-in-cryogenic-environment/12690930 cascademicrotech@slideshare.net(cascademicrotech) Wafer-Level RF MEMS Devices Characterization in Cryogenic Environment cascademicrotech In the following presentation, we highlight field-proven, relevant test solutions based on a cryogenic wafer-probe station. Special attention is given to overcoming the calibration standards instability, contact repeatability and reliability issues caused by the extreme environmental conditions. We will present the solution that enabled characterizing of RF MEMS devices at cryogenic condition with the benchmarking level of measurement accuracy and confidence. <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/ets2011-rfmems-120425160919-phpapp02-thumbnail.jpg?width=120&amp;height=120&amp;fit=bounds" /><br> In the following presentation, we highlight field-proven, relevant test solutions based on a cryogenic wafer-probe station. Special attention is given to overcoming the calibration standards instability, contact repeatability and reliability issues caused by the extreme environmental conditions. We will present the solution that enabled characterizing of RF MEMS devices at cryogenic condition with the benchmarking level of measurement accuracy and confidence.
Wafer-Level RF MEMS Devices Characterization in Cryogenic Environment from Cascade Microtech, Inc.
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]]> Wed, 09 Nov 2011 19:02:49 GMT /slideshow/sparameter-calibration-of-twoport-setup/10096948 cascademicrotech@slideshare.net(cascademicrotech) S-Parameter Calibration of Two-Port Setup cascademicrotech <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/eumw2011presentation-111109190251-phpapp02-thumbnail.jpg?width=120&amp;height=120&amp;fit=bounds" /><br>
S-Parameter Calibration of Two-Port Setup from Cascade Microtech, Inc.
]]> 6131 9 https://cdn.slidesharecdn.com/ss_thumbnails/eumw2011presentation-111109190251-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds presentation Black http://activitystrea.ms/schema/1.0/post http://activitystrea.ms/schema/1.0/posted 1 Cacade Microtech Investors Presentation /cascademicrotech/cacade-microtech-investors-presentation cscdpresentation-110810161842-phpapp02
Achieving Market Dominance through Technology Leadership -Cascade Microtech, Inc. is the leading provider of advanced probing systems, non-memory probes and sockets, from design through production]]>
Achieving Market Dominance through Technology Leadership -Cascade Microtech, Inc. is the leading provider of advanced probing systems, non-memory probes and sockets, from design through production]]> Wed, 10 Aug 2011 16:18:37 GMT /cascademicrotech/cacade-microtech-investors-presentation cascademicrotech@slideshare.net(cascademicrotech) Cacade Microtech Investors Presentation cascademicrotech Achieving Market Dominance through Technology Leadership -Cascade Microtech, Inc. is the leading provider of advanced probing systems, non-memory probes and sockets, from design through production <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/cscdpresentation-110810161842-phpapp02-thumbnail.jpg?width=120&amp;height=120&amp;fit=bounds" /><br> Achieving Market Dominance through Technology Leadership -Cascade Microtech, Inc. is the leading provider of advanced probing systems, non-memory probes and sockets, from design through production
Cacade Microtech Investors Presentation from Cascade Microtech, Inc.
]]> 1082 5 https://cdn.slidesharecdn.com/ss_thumbnails/cscdpresentation-110810161842-phpapp02-thumbnail.jpg?width=120&height=120&fit=bounds presentation Black http://activitystrea.ms/schema/1.0/post http://activitystrea.ms/schema/1.0/posted 1 Electrical Performance Effects on Wafer Level Test /slideshow/electrical-performance-effects-on-wafer-level-test/8667280 s0632fredd63-2011ppt-110722175625-phpapp01
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]]> Fri, 22 Jul 2011 17:56:24 GMT /slideshow/electrical-performance-effects-on-wafer-level-test/8667280 cascademicrotech@slideshare.net(cascademicrotech) Electrical Performance Effects on Wafer Level Test cascademicrotech <img style="border:1px solid #C3E6D8;float:right;" alt="" src="https://cdn.slidesharecdn.com/ss_thumbnails/s0632fredd63-2011ppt-110722175625-phpapp01-thumbnail.jpg?width=120&amp;height=120&amp;fit=bounds" /><br>
Electrical Performance Effects on Wafer Level Test from Cascade Microtech, Inc.
]]> 1371 3 https://cdn.slidesharecdn.com/ss_thumbnails/s0632fredd63-2011ppt-110722175625-phpapp01-thumbnail.jpg?width=120&height=120&fit=bounds presentation Black http://activitystrea.ms/schema/1.0/post http://activitystrea.ms/schema/1.0/posted 1 https://cdn.slidesharecdn.com/profile-photo-cascademicrotech-48x48.jpg?cb=1523111672 Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in the design, development and manufacture of advanced wafer probing solutions for the electrical measurement and test of semiconductor integrated circuits and chips. www.cascademicrotech.com https://cdn.slidesharecdn.com/ss_thumbnails/ets2011-rfmems-120425160919-phpapp02-thumbnail.jpg?width=320&height=320&fit=bounds slideshow/waferlevel-rf-mems-devices-characterization-in-cryogenic-environment/12690930 Wafer-Level RF MEMS De... https://cdn.slidesharecdn.com/ss_thumbnails/eumw2011presentation-111109190251-phpapp02-thumbnail.jpg?width=320&height=320&fit=bounds slideshow/sparameter-calibration-of-twoport-setup/10096948 S-Parameter Calibratio... https://cdn.slidesharecdn.com/ss_thumbnails/cscdpresentation-110810161842-phpapp02-thumbnail.jpg?width=320&height=320&fit=bounds cascademicrotech/cacade-microtech-investors-presentation Cacade Microtech Inves...