Exploiting process variability in voltage frequency control
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This document discusses techniques for exploiting process variability in integrated circuits to improve voltage/frequency control, including variability aware dynamic voltage and frequency scaling (DVFS) using speed binning and a 16 core chip organized as a 4x4 mesh. It also describes modeling of channel length variability and its impact on leakage current and frequency. Different DVFS strategies are evaluated like threshold-based scaling, greedy search to optimize energy per instruction, and maximum throughput under a power budget. Fine-grained and coarse-grained control at the voltage/frequency island level is also examined.
Exploiting process variability in voltage frequency control
- 1. Exploiting Process Variability in Voltage/Frequency Control Diego Ruggeri
- 2. Variability aware DVFS Speed binning 16 core : 4 x 4 mash Power / Throughput 2 VFI DVFS: Threshold, Greedy search, MaxBIPS
- 6. Modeling Channel length Leakage and Frequence
- 11. DVFS strategies Threshold Scales V/F according to utilization Aware version: threshold set per VFI Greedy search Scale V/F to keep measured EPI2 (energy per instruction) optimal Aware version: MaxBIPS Maximum throughput meeting power budget (80%)
- 13. Fine Grained (VFI) DVTS
- 15. Fine Grained VFI DVTS
- 16. Coarse Grained VFI DVTS
- 17. Topologies