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Israel Israel

professor at Ariel University

Electronics / Computer Hardware

Professor Bernstein’s expertise lie in several areas of nano-scale micro-electronic device reliability and physics of failure research including packaging, system reliability modeling, gate oxide integrity, radiation effects, Flash NAND and NOR memory, SRAM and DRAM, MEMS and laser programmable metal interconnect. He has licensed his technology and consulted for RFID and SRAM applications related to fuse and redundancy and for programmable gate arrays and system-on-chip. He directs the Laboratory for Failure Analysis and Reliability of Electronic Systems, teaches VLSI design courses and heads the VLSI program at Ariel University. His Laboratory is a center of research activity dedicated .