Expertise in reliability physics and statistics (life data analysis) for application to semiconductor nanodevices (logic and memory) at the front-end, back-end and packaging level and manufacturing technology (industrial engineering) in general.
Future Goals are : (A) To establish a Centre for Advancement of Reliability Engineering (CARE) exploring new applications and horizons for application of reliability and prognostic theories / algorithms. (B) To join the academia and spearhead design for reliability (DFR) initiatives for semiconductor technology.
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