Selected ion flow tube mass spectrometry (SIFT-MS) is an extremely elegant technique, which finds its origin in the study of gas-phase ion-molecule reaction kinetics. It combines soft chemical ionization with prior knowledge of reaction schemes and reaction kinetics (rate coefficients) to quantitatively measure target components at trace and ultratrace levels. Since it was first described in 1996, the technique has progressed tremendously. It is recognized as a powerful alternative to GC and GC/MS, particularly for demanding applications, such as real-time monitoring and trace level analysis of reactive components.
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