This document summarizes a student's presentation on using a resonance method to measure the dielectric properties of materials at microwave frequencies. The student investigated calculating the dielectric constant, quality factor, and loss tangent of samples. Tests were conducted using a vector network analyzer and coaxial resonator on epoxy compound samples. Measurement errors were calculated and the dielectric constant of epoxy was found to depend on frequency. The method allows evaluation of degradation in integrated circuit packages and dielectric materials. In conclusion, the resonance method was shown to be accurate, reliable, and informative for these measurements.
1 of 9
Downloaded 22 times
More Related Content
Dvortsov A. V., "Resonance Method of Measuring a Stuff Dielectric Properties at Microwave Frequencies"
1. 1886Saint Petersburg?Electrotechnical University?"LETI "TEP Conference presentationTheme: ?Resonance Method of Measuring a Stuff DielectricProperties at Microwave Frequencies?Student: Dvortsov A. V.Managers: Medvedeva N. Y.Mikerov A. G.
2. The purpose of the work: Investigation of?the resonance?method of measuring?the dielectric properties?of materials?at microwave?frequencies,?which includes:methodology for calculating?the dielectric constant,?quality factor?and loss tangent?of the samples?of materialscalculation?error of methodusing this?method?to study the?degradation?phenomena?in?packages of integrated circuits and?dielectric?materials.Dvortsov A. V., 62022
3. Test?benchMeasured?parameters:-resonant frequency,-transfer coefficient(S21-parameter)Vector?Network Analyzer Rohde&Schwarz ZVA-40Characteristics?of the vector?network analyzer Rohde&SchwarzZVA-40:Operating?frequency range:10 MHz-40 GHzThe sensitivity of?the frequency -0,5 HzSensitivity?of the transfer -0,01 dB-no sample- patternS21, dB0-50-100-150-2001231.52.5GHzCoaxial?ResonatorDvortsov A. V., 62023
10. The calculation of?the dielectric?constant?epoxy?compound?and determined?its?dependence?on?frequency.
11. Evaluated?the possibility?of applying the method?to assess the degradation?phenomena?in?packages?of integrated circuits and dielectric?materials.Studies have?shown?that the?investigated?method?is?accurate, reliable?and?informative.8Dvortsov A. V., 6202