際際滷

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GRR Made Simple
1
When looking at GRR and
MSA all the information is
EXACTLY CORRECT
There is however a LOT of detailed information to
understand
2
Is there a way to make it
simpler to understand
and implement?
Especially for Test
Engineers?
3
YES!!
4
There are 2 boundary conditions
that a test engineer can
understand that are only
Sometimes shown
5
This is the 鍖rst!!
6
This is the second!!
7
Using freely available
spreadsheet off of the Internet
for Excel analysis of GRR a
model was developed for
analysis using these 2
boundary conditions
8
Test Engineers
have been told to
follow 2 boundary
conditions
1. The error in the
measurement has to be 10
times less than the
measured value.
2. The error between the
USL and LSL has to be 10%
of the difference between
USL and LSL
X	Instrument	Error	
0
2X	Instrument	Error	
LSL
USL
CV
CV	-	Boundary Condition # 2
LCV - Boundary Condition # 1
Test Engineering Boundary Conditions
LCV
Where	
USL	=	Upper	Speci鍖ca>on	Limit								LSL	=	Lower	Speci鍖ca>on	Limit
LCV	=	Lowest	Capable	Value 							CV	=	USL	-	LSL	=	Di鍖eren>al	Capability	
The variable, the RED X, needs to be understood
9
GRR Tools
Critical Evaluation with underlying Test
Engineering Boundary Conditions
The model created is using an OE (offset error of
賊4mV with GE (gain error = 0%). The initial
evaluation used 10 samples, 3 tests, 3 Testers. One
tester had 0 offset, another -4mV, and the third
+4mV. Repeatability was 0.0001 to insure that just
equipment reproducibility is what is being examined.
Manage Instrument Error to achieve a passing
qualification on devices for GRR: ANOVA or XBAR&R
The experiment objective is to understand instrument
specification and how it affects GRR ALONE
10
GRR Tools
Manage Instrument Error to achieve a passing
qualification on devices for GRR: ANOVA or XBAR&R
GRR Calculation
# Samples
# Testers
Methods
# of Measurements
USL & LSL
Objective: Understand GRR from Instrument
Error Perspective
2-10 samples
Sample location: determines GRR
Random Selection
Intelligent selection
Plus Offset - one tester
Zero Offset - one tester
Minus Offset - one tester
ANOVA
Xbar&R
One value - Ideal
Second value: + 0.0001
Third value: - 0.0001
Note: sample location is
NOT usually looked at;
and it turns out to be
very important
11
How do these affect GRR
Results
 There are essentially 2 methods for doing GRR
 ANOVA
 Xbar&R
 Spreadsheets for each can be found on the internet free of
charge. Some with just one of the methods or the other, and
at least one with both methods in the spreadsheet.
 Each method was confirmed to give the same results with
identical data when comparing ANOVA to ANOVA and
Xbar&R to Xbar&R
12
The question is:
Are the 2 boundary conditions listed on slides 6 and 7 necesary
and sufficient to insure that the goal of GRR 10% passes?
1. Random samples within USL and LSL
2. 10 perfect evenly distributed samples within USL and LSL
3. 10 select samples to cause worst case within center 賊50% of perfect samples placement
4. 10 select samples to cause worst case within center 賊100% of perfect samples placement
5. 10 select samples to cause worst case within center 賊150% of perfect samples placement
6. 10 select samples to cause worst case within center 賊200% of perfect samples placement
6 ways to look at:
# Instrument errors range from 10X to shown on graphs
13
Necessary Equations
The diagram on 際際滷 2 shows 11X for instrument errors
to take into account the need for repeatability. This
works out to a GRR of approximately 9% for just
instrument errors, which is the objective of the exercise
USL =
LSL 1+10GE( )+ 20OE
110GE
USL  LSL = CV
CV = 10 GE i(USL + LSL)+ 2 iOE( )
CV = 20 iOE +10 GE i(USL + LSL)( )
LSL = +LCV =
OE
0.1 GE
+LCV =
OE
0.1 GE
The model created us using an OE (offset error of 賊4mV with GE
(gain error = 0%). The initial evaluation used 10 samples, 3 tests, 3
Testers. One tester had 0 offset, another -4mV, and the third +4mV.
Repeatability was 0.0001 to insure that just equipment reproducibility
is what is being examined.
14
0
LSL
USL
賊100% of perfect
samples
placement
賊50% of perfect
samples
placement
0
LSL
USL
Random perfect
samples
placement
0
LSL
USL
Perfect Placement
賊100 % Placement - Worst Case
0
LSL
USL
0
LSL
USL
Perfect Placement
賊50 % Placement - Worst Case
15
# Instrument errors range from 10X to what is shown on graph, 10 measurement points perfectly evenly distributed
0
LSL
USL
10X 11X
0
LSL
USL
12X
0
LSL
USL
13X
0
LSL
USL
14X
0
LSL
USL
15X
0
LSL
USL
16X
0
LSL
USL
24X
0
LSL
USL
23X
0
LSL
USL
22X
0
LSL
USL
21X
0
LSL
USL
20X
0
LSL
USL
19X
0
LSL
USL
18X
0
LSL
USL
17X
0
LSL
USL
Red lines represent perfect evenly spaced samples
16
Random selection of measurement for 10 DUTs with zero offset, +
offset and - offset.
1.5200 10 device randomly selected measurement values
using Monte Carlo simulations for Xbar&R from Statistical
Solutions, Tolerance and GRR results.
2.1010 10 device randomly selected measurement values
using Monte Carlo simulations using the ANOVA method
from www.dmaictools.com, Tolerance and GRR results.
Lower Specification limits started at 40mV (10X), Upper Specification limit start at 120mV (10X), ranging to
40X instrument errors. This means that the difference between USL-LSL, ranged from 10X to 40X.
Simulations were done for a process distribution width of 5.15 (encloses the central 99% of the process
distribution).
0
LSL
USL
Please note that the number of instrument
errors is the inverse of the instrument error
17
409 12 14 16 18 20 22 24 26 28 30 32 34 36 38
1
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
(# X) Number of Instrument Errors
Percentage(%)over10%
GRR%	Xbar&R
Xbar&R	Monte	Carlo	Simula3on	
in	Excel.	5200	simula3ons	of	10
devices.	
Random	devices	within	limits	
Using	Gage	R&R	
(XBar&R	Motorola	Version)	
from		Sta;s;cal		Solu;ons
Please	note	that	11X	and	
greater	is	acceptable.	However	
neither	the	Xbar&R	Method	
nor	ANOVA	correctly	calculate	
GRR	at	the	corners	of
instrument	limits
GRR%	ANOVA
ANOVA	Monte	Carlo	Simula3on	
in	Excel.	1010	simula3ons	of	10
devices.	
Random	devices	within	limits	
賊 4mV offset Error
LSL starts at +40mV (10X)
USL starts at +120mV
USL-LSL starts at 80mV (10X)
Anova - www.dmaictools.com/measure/grr
30.0
Percentage of simulations (Monte Carlo) that showed the instances greater than GRR
10% for each Instrument X.
To read the graph, 20 on the X axis is the number of instrument errors. For GRR ANOVA,
approximately 0.5% of the simulation results showed greater than a GRR of 10%. For
GRR Xbar&R 1% of the simulation results showed greater than a GRR of 10%.
0
LSL
USL
Random
samples
placement
18
4. 10 select perfect samples to cause worst case
within center 賊50% of perfect samples placement
NOTE: solid line on graph of next slide
1. ANOVA 5.15 Standard deviations
2.Xbar&R 5.15 Standard deviations
Lower Specification limits started at 40mV (10X), Upper Specification limit
start at 120mV (10X), ranging to 40X instrument errors. This means that
the difference between USL-LSL, ranged from 10X and following.
Calculations were done for a process distribution width of 5.15 (encloses
the central 99% of the process distribution) at worst case values..
0
LSL
USL
賊50% of perfect
samples
placement
Please note that the number of instrument
errors is the inverse of the instrument error
19
4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
0.1
0.035
0.04
0.045
0.05
0.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
# Instrument Errors
GRR
ANOVA		賊50%	of	perfect	sample	placement
ANOVA		賊100%	of	perfect	sample	placement
10	Perfectly	Measured	Device	Samples	for	Quali鍖ca:on,	1	tester	0	o鍖set,	1	tester	+o鍖set,	1	tester	-	o鍖set
ANOVA		賊150%	of	perfect	sample	placement
ANOVA		賊200%	of	perfect	sample	placement
Anova	Perfect			16.5	(6.06%)
Anova	賊50	 			17.8	(5.62%)
Anova	賊100						19.3	(5.18%)
Anova	賊150						21.0	(4.76%)
Anova	賊200						22.9	(4.37%)
Xbar	Perfect					37.1	(2.70%)
Xbar	賊50 				39.3	(2.54%)
Xbar	賊100 				41.7	(2.40%)
Xbar	賊150 				44.4	(2.25%)
Xbar	賊200 				47.8	(2.09%)
息	Van	Brollini	2016
息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016
息 Van Brollini 2016息 Van Brollini 2016
息 Van Brollini 2016
息 Van Brollini 2016
ANOVA		perfect	sample	placement
Anova	Perfect						33.1	(3.02%)
Anova	賊50	 								35.7	(2.80%)
Anova	賊100 								38.8	(2.58%)
Anova	賊150 								42.2	(2.37%)
Anova	賊200 								46.1	(2.17%)
Xbar	Perfect				18.4	(5.43%)
Xbar	賊50											19.5	(5.13%)
Xbar	賊100 		20.7	(4.83%)
Xbar	賊150 		22.0	(4.55%)
Xbar	賊200 		23.7	(4.22%)
Note:	%	numbers	shown	are	range	percent	error
E鍖ect	of	Only	Device	Speci鍖ca:on	
and	Sample	Placement	on	GRR
All	Device	Measurements	Perfect
賊50% perfect sample placement
20
Next slide contains ANOVA
1. 10 perfect samples
2. 10 perfect samples 賊50%
3. 10 perfect samples 賊100%
4. 10 perfect samples 賊150%
5. 10 perfect samples 賊200%
21
4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
0.1
0.035
0.04
0.045
0.05
0.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
# Instrument Errors
GRR
ANOVA		賊50%	of	perfect	sample	placement
ANOVA		賊100%	of	perfect	sample	placement
10	Perfectly	Measured	Device	Samples	for	Quali鍖ca:on,	1	tester	0	o鍖set,	1	tester	+o鍖set,	1	tester	-	o鍖set
ANOVA		賊150%	of	perfect	sample	placement
ANOVA		賊200%	of	perfect	sample	placement
Anova	Perfect			16.5	(6.06%)
Anova	賊50	 			17.8	(5.62%)
Anova	賊100						19.3	(5.18%)
Anova	賊150						21.0	(4.76%)
Anova	賊200						22.9	(4.37%)
Xbar	Perfect					37.1	(2.70%)
Xbar	賊50 				39.3	(2.54%)
Xbar	賊100 				41.7	(2.40%)
Xbar	賊150 				44.4	(2.25%)
Xbar	賊200 				47.8	(2.09%)
息	Van	Brollini	2016
息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016
息 Van Brollini 2016息 Van Brollini 2016
息 Van Brollini 2016
息 Van Brollini 2016
ANOVA		perfect	sample	placement
Anova	Perfect						33.1	(3.02%)
Anova	賊50	 								35.7	(2.80%)
Anova	賊100 								38.8	(2.58%)
Anova	賊150 								42.2	(2.37%)
Anova	賊200 								46.1	(2.17%)
Xbar	Perfect				18.4	(5.43%)
Xbar	賊50											19.5	(5.13%)
Xbar	賊100 		20.7	(4.83%)
Xbar	賊150 		22.0	(4.55%)
Xbar	賊200 		23.7	(4.22%)
Note:	%	numbers	shown	are	range	percent	error
E鍖ect	of	Only	Device	Speci鍖ca:on	
and	Sample	Placement	on	GRR
All	Device	Measurements	Perfect
22
Next 4 slides using
ANOVA show how to use
23
4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
0.1
0.035
0.04
0.045
0.05
0.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
# Instrument Errors
GRR
ANOVA		賊50%	of	perfect	sample	placement
ANOVA		賊100%	of	perfect	sample	placement
10	Perfectly	Measured	Device	Samples	for	Quali鍖ca:on,	1	tester	0	o鍖set,	1	tester	+o鍖set,	1	tester	-	o鍖set
ANOVA		賊150%	of	perfect	sample	placement
ANOVA		賊200%	of	perfect	sample	placement
Anova	Perfect			16.5	(6.06%)
Anova	賊50	 			17.8	(5.62%)
Anova	賊100						19.3	(5.18%)
Anova	賊150						21.0	(4.76%)
Anova	賊200						22.9	(4.37%)
Xbar	Perfect					37.1	(2.70%)
Xbar	賊50 				39.3	(2.54%)
Xbar	賊100 				41.7	(2.40%)
Xbar	賊150 				44.4	(2.25%)
Xbar	賊200 				47.8	(2.09%)
息	Van	Brollini	2016
息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016
息 Van Brollini 2016息 Van Brollini 2016
息 Van Brollini 2016
息 Van Brollini 2016
ANOVA		perfect	sample	placement
Anova	Perfect						33.1	(3.02%)
Anova	賊50	 								35.7	(2.80%)
Anova	賊100 								38.8	(2.58%)
Anova	賊150 								42.2	(2.37%)
Anova	賊200 								46.1	(2.17%)
Xbar	Perfect				18.4	(5.43%)
Xbar	賊50											19.5	(5.13%)
Xbar	賊100 		20.7	(4.83%)
Xbar	賊150 		22.0	(4.55%)
Xbar	賊200 		23.7	(4.22%)
Note:	%	numbers	shown	are	range	percent	error
E鍖ect	of	Only	Device	Speci鍖ca:on	
and	Sample	Placement	on	GRR
All	Device	Measurements	Perfect
Have to choose something LESS than
10%. Need room for repeatability
24
4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
0.1
0.035
0.04
0.045
0.05
0.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
# Instrument Errors
GRR
ANOVA		賊50%	of	perfect	sample	placement
ANOVA		賊100%	of	perfect	sample	placement
10	Perfectly	Measured	Device	Samples	for	Quali鍖ca:on,	1	tester	0	o鍖set,	1	tester	+o鍖set,	1	tester	-	o鍖set
ANOVA		賊150%	of	perfect	sample	placement
ANOVA		賊200%	of	perfect	sample	placement
Anova	Perfect			16.5	(6.06%)
Anova	賊50	 			17.8	(5.62%)
Anova	賊100						19.3	(5.18%)
Anova	賊150						21.0	(4.76%)
Anova	賊200						22.9	(4.37%)
Xbar	Perfect					37.1	(2.70%)
Xbar	賊50 				39.3	(2.54%)
Xbar	賊100 				41.7	(2.40%)
Xbar	賊150 				44.4	(2.25%)
Xbar	賊200 				47.8	(2.09%)
息	Van	Brollini	2016
息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016
息 Van Brollini 2016息 Van Brollini 2016
息 Van Brollini 2016
息 Van Brollini 2016
ANOVA		perfect	sample	placement
Anova	Perfect						33.1	(3.02%)
Anova	賊50	 								35.7	(2.80%)
Anova	賊100 								38.8	(2.58%)
Anova	賊150 								42.2	(2.37%)
Anova	賊200 								46.1	(2.17%)
Xbar	Perfect				18.4	(5.43%)
Xbar	賊50											19.5	(5.13%)
Xbar	賊100 		20.7	(4.83%)
Xbar	賊150 		22.0	(4.55%)
Xbar	賊200 		23.7	(4.22%)
Note:	%	numbers	shown	are	range	percent	error
E鍖ect	of	Only	Device	Speci鍖ca:on	
and	Sample	Placement	on	GRR
All	Device	Measurements	Perfect
Choose 24 Instrument Errors (4.17%)
25
4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
0.1
0.035
0.04
0.045
0.05
0.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
# Instrument Errors
GRR
ANOVA		賊50%	of	perfect	sample	placement
ANOVA		賊100%	of	perfect	sample	placement
10	Perfectly	Measured	Device	Samples	for	Quali鍖ca:on,	1	tester	0	o鍖set,	1	tester	+o鍖set,	1	tester	-	o鍖set
ANOVA		賊150%	of	perfect	sample	placement
ANOVA		賊200%	of	perfect	sample	placement
Anova	Perfect			16.5	(6.06%)
Anova	賊50	 			17.8	(5.62%)
Anova	賊100						19.3	(5.18%)
Anova	賊150						21.0	(4.76%)
Anova	賊200						22.9	(4.37%)
Xbar	Perfect					37.1	(2.70%)
Xbar	賊50 				39.3	(2.54%)
Xbar	賊100 				41.7	(2.40%)
Xbar	賊150 				44.4	(2.25%)
Xbar	賊200 				47.8	(2.09%)
息	Van	Brollini	2016
息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016
息 Van Brollini 2016息 Van Brollini 2016
息 Van Brollini 2016
息 Van Brollini 2016
ANOVA		perfect	sample	placement
Anova	Perfect						33.1	(3.02%)
Anova	賊50	 								35.7	(2.80%)
Anova	賊100 								38.8	(2.58%)
Anova	賊150 								42.2	(2.37%)
Anova	賊200 								46.1	(2.17%)
Xbar	Perfect				18.4	(5.43%)
Xbar	賊50											19.5	(5.13%)
Xbar	賊100 		20.7	(4.83%)
Xbar	賊150 		22.0	(4.55%)
Xbar	賊200 		23.7	(4.22%)
Note:	%	numbers	shown	are	range	percent	error
E鍖ect	of	Only	Device	Speci鍖ca:on	
and	Sample	Placement	on	GRR
All	Device	Measurements	Perfect
If sample selection process is more or
less evenly distributed then error caused
by instrument specification will result in
 6.6 - 7.9% GRR leaving plenty of room
for repeatability to achieve final goal of
10% GRR
26
Next slide contains Xbar&R
Xbar&R is more stringent than ANOVA
1. 10 perfect samples
2. 10 perfect samples 賊50%
3. 10 perfect samples 賊100%
4. 10 perfect samples 賊150%
5. 10 perfect samples 賊200%
27
4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
0.1
0.035
0.04
0.045
0.05
0.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
# Instrument Errors
GRR
Xbar&R		賊50%	of	perfect	sample	placement
Xbar&R		賊100%	of	perfect	sample	placement
10	Perfectly	Measured	Device	Samples	for	Quali鍖ca:on,	1	tester	0	o鍖set,	1	tester	+o鍖set,	1	tester	-	o鍖set
Xbar&R		賊150%	of	perfect	sample	placement
Xbar&R		賊200%	of	perfect	sample	placement
Xbar	Perfect					18.4	(5.43%)
Xbar	賊50											19.5	(5.13%)
Xbar	賊100 		20.7	(4.83%)
Xbar	賊150 		22.0	(4.55%)
Xbar	賊200 		23.7	(4.22%)
Xbar	Perfect					37.1	(2.70%)
Xbar	賊50 				39.3	(2.54%)
Xbar	賊100 				41.7	(2.40%)
Xbar	賊150 				44.4	(2.25%)
Xbar	賊200 				47.8	(2.09%)
息	Van	Brollini	2016
息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016
息 Van Brollini 2016息 Van Brollini 2016
息 Van Brollini 2016
息 Van Brollini 2016
Xbar&R	perfect	sample	placement
Anova	Perfect			16.5	(6.06%)
Anova	賊50	 				17.8	(5.62%)
Anova	賊100							19.3	(5.18%)
Anova	賊150							21.0	(4.76%)
Anova	賊200							22.9	(4.37%)
Anova	Perfect						33.1	(3.02%)
Anova	賊50	 								35.7	(2.80%)
Anova	賊100 								38.8	(2.58%)
Anova	賊150 								42.2	(2.37%)
Anova	賊200 								46.1	(2.17%)
Note:	%	numbers	shown	are	range	percent	error
E鍖ect	of	Only	Device	Speci鍖ca:on	
and	Sample	Placement	on	GRR
All	Device	Measurements	Perfect
Note: Xbar&R is more stringent to pass.
Choose 25 instrument errors
28
4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
0.1
0.035
0.04
0.045
0.05
0.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
# Instrument Errors
GRR
Xbar&R		賊50%	of	perfect	sample	placement
Xbar&R		賊100%	of	perfect	sample	placement
10	Perfectly	Measured	Device	Samples	for	Quali鍖ca:on,	1	tester	0	o鍖set,	1	tester	+o鍖set,	1	tester	-	o鍖set
Xbar&R		賊150%	of	perfect	sample	placement
Xbar&R		賊200%	of	perfect	sample	placement
Xbar	Perfect					18.4	(5.43%)
Xbar	賊50											19.5	(5.13%)
Xbar	賊100 		20.7	(4.83%)
Xbar	賊150 		22.0	(4.55%)
Xbar	賊200 		23.7	(4.22%)
Xbar	Perfect					37.1	(2.70%)
Xbar	賊50 				39.3	(2.54%)
Xbar	賊100 				41.7	(2.40%)
Xbar	賊150 				44.4	(2.25%)
Xbar	賊200 				47.8	(2.09%)
息	Van	Brollini	2016
息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016
息 Van Brollini 2016息 Van Brollini 2016
息 Van Brollini 2016
息 Van Brollini 2016
Xbar&R	perfect	sample	placement
Anova	Perfect			16.5	(6.06%)
Anova	賊50	 				17.8	(5.62%)
Anova	賊100							19.3	(5.18%)
Anova	賊150							21.0	(4.76%)
Anova	賊200							22.9	(4.37%)
Anova	Perfect						33.1	(3.02%)
Anova	賊50	 								35.7	(2.80%)
Anova	賊100 								38.8	(2.58%)
Anova	賊150 								42.2	(2.37%)
Anova	賊200 								46.1	(2.17%)
Note:	%	numbers	shown	are	range	percent	error
E鍖ect	of	Only	Device	Speci鍖ca:on	
and	Sample	Placement	on	GRR
All	Device	Measurements	Perfect
29
For 9% GRR the correct choices for allowable
instrument error to achieve the desired 10%
GRR with the 1% selection for repeatability are:
 Primary conclusion: Initial boundary condition is NOT SUFFICIENT to pass GRR at all!!
 Perfect parts and ONLY instrument error use 5.43% to 6.06% of the GRR 10% Goal
 Perfect parts and ONLY instrument error use 2.7% to 3.02% of the GRR 5% Goal
 Perfect parts, ONLY instrument and Sample Placement variation error use 4.22% to 5.62% of the GRR 10% Goal
 Perfect parts, ONLY instrument and Sample Placement variation error use 2.09% to 2.80% of the GRR 5% Goal
 Sample placement accounts for up to 1.3% of GRR 10% Goal for ANOVA
 Sample placement accounts for up to 0.63% of GRR 10% Goal for XBAR&R
Anova	Perfect			16.5	(6.06%)	
Anova	賊50		 					17.8	(5.62%)	
Anova	賊100						19.3	(5.18%)	
Anova	賊150						21.0	(4.76%)	
Anova	賊200						22.9	(4.37%)
Xbar	Perfect				18.4	(5.43%)	
Xbar	賊50	 			19.5	(5.13%)	
Xbar	賊100	 		20.7	(4.83%)	
Xbar	賊150	 		22.0	(4.55%)	
Xbar	賊200	 		23.7	(4.22%)
Xbar	Perfect					37.1	(2.70%)	
Xbar	賊50	 				39.3	(2.54%)	
Xbar	賊100	 				41.7	(2.40%)	
Xbar	賊150	 				44.4	(2.25%)	
Xbar	賊200	 				47.8	(2.09%)
Anova	Perfect						33.1	(3.02%)	
Anova	賊50		 								35.7	(2.80%)	
Anova	賊100	 								38.8	(2.58%)	
Anova	賊150	 								42.2	(2.37%)	
Anova	賊200	 								46.1	(2.17%)
9% GRR Target 4.5% GRR Target
30
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GRR Made Easy

  • 2. When looking at GRR and MSA all the information is EXACTLY CORRECT There is however a LOT of detailed information to understand 2
  • 3. Is there a way to make it simpler to understand and implement? Especially for Test Engineers? 3
  • 5. There are 2 boundary conditions that a test engineer can understand that are only Sometimes shown 5
  • 6. This is the 鍖rst!! 6
  • 7. This is the second!! 7
  • 8. Using freely available spreadsheet off of the Internet for Excel analysis of GRR a model was developed for analysis using these 2 boundary conditions 8
  • 9. Test Engineers have been told to follow 2 boundary conditions 1. The error in the measurement has to be 10 times less than the measured value. 2. The error between the USL and LSL has to be 10% of the difference between USL and LSL X Instrument Error 0 2X Instrument Error LSL USL CV CV - Boundary Condition # 2 LCV - Boundary Condition # 1 Test Engineering Boundary Conditions LCV Where USL = Upper Speci鍖ca>on Limit LSL = Lower Speci鍖ca>on Limit LCV = Lowest Capable Value CV = USL - LSL = Di鍖eren>al Capability The variable, the RED X, needs to be understood 9
  • 10. GRR Tools Critical Evaluation with underlying Test Engineering Boundary Conditions The model created is using an OE (offset error of 賊4mV with GE (gain error = 0%). The initial evaluation used 10 samples, 3 tests, 3 Testers. One tester had 0 offset, another -4mV, and the third +4mV. Repeatability was 0.0001 to insure that just equipment reproducibility is what is being examined. Manage Instrument Error to achieve a passing qualification on devices for GRR: ANOVA or XBAR&R The experiment objective is to understand instrument specification and how it affects GRR ALONE 10
  • 11. GRR Tools Manage Instrument Error to achieve a passing qualification on devices for GRR: ANOVA or XBAR&R GRR Calculation # Samples # Testers Methods # of Measurements USL & LSL Objective: Understand GRR from Instrument Error Perspective 2-10 samples Sample location: determines GRR Random Selection Intelligent selection Plus Offset - one tester Zero Offset - one tester Minus Offset - one tester ANOVA Xbar&R One value - Ideal Second value: + 0.0001 Third value: - 0.0001 Note: sample location is NOT usually looked at; and it turns out to be very important 11
  • 12. How do these affect GRR Results There are essentially 2 methods for doing GRR ANOVA Xbar&R Spreadsheets for each can be found on the internet free of charge. Some with just one of the methods or the other, and at least one with both methods in the spreadsheet. Each method was confirmed to give the same results with identical data when comparing ANOVA to ANOVA and Xbar&R to Xbar&R 12
  • 13. The question is: Are the 2 boundary conditions listed on slides 6 and 7 necesary and sufficient to insure that the goal of GRR 10% passes? 1. Random samples within USL and LSL 2. 10 perfect evenly distributed samples within USL and LSL 3. 10 select samples to cause worst case within center 賊50% of perfect samples placement 4. 10 select samples to cause worst case within center 賊100% of perfect samples placement 5. 10 select samples to cause worst case within center 賊150% of perfect samples placement 6. 10 select samples to cause worst case within center 賊200% of perfect samples placement 6 ways to look at: # Instrument errors range from 10X to shown on graphs 13
  • 14. Necessary Equations The diagram on 際際滷 2 shows 11X for instrument errors to take into account the need for repeatability. This works out to a GRR of approximately 9% for just instrument errors, which is the objective of the exercise USL = LSL 1+10GE( )+ 20OE 110GE USL LSL = CV CV = 10 GE i(USL + LSL)+ 2 iOE( ) CV = 20 iOE +10 GE i(USL + LSL)( ) LSL = +LCV = OE 0.1 GE +LCV = OE 0.1 GE The model created us using an OE (offset error of 賊4mV with GE (gain error = 0%). The initial evaluation used 10 samples, 3 tests, 3 Testers. One tester had 0 offset, another -4mV, and the third +4mV. Repeatability was 0.0001 to insure that just equipment reproducibility is what is being examined. 14
  • 15. 0 LSL USL 賊100% of perfect samples placement 賊50% of perfect samples placement 0 LSL USL Random perfect samples placement 0 LSL USL Perfect Placement 賊100 % Placement - Worst Case 0 LSL USL 0 LSL USL Perfect Placement 賊50 % Placement - Worst Case 15
  • 16. # Instrument errors range from 10X to what is shown on graph, 10 measurement points perfectly evenly distributed 0 LSL USL 10X 11X 0 LSL USL 12X 0 LSL USL 13X 0 LSL USL 14X 0 LSL USL 15X 0 LSL USL 16X 0 LSL USL 24X 0 LSL USL 23X 0 LSL USL 22X 0 LSL USL 21X 0 LSL USL 20X 0 LSL USL 19X 0 LSL USL 18X 0 LSL USL 17X 0 LSL USL Red lines represent perfect evenly spaced samples 16
  • 17. Random selection of measurement for 10 DUTs with zero offset, + offset and - offset. 1.5200 10 device randomly selected measurement values using Monte Carlo simulations for Xbar&R from Statistical Solutions, Tolerance and GRR results. 2.1010 10 device randomly selected measurement values using Monte Carlo simulations using the ANOVA method from www.dmaictools.com, Tolerance and GRR results. Lower Specification limits started at 40mV (10X), Upper Specification limit start at 120mV (10X), ranging to 40X instrument errors. This means that the difference between USL-LSL, ranged from 10X to 40X. Simulations were done for a process distribution width of 5.15 (encloses the central 99% of the process distribution). 0 LSL USL Please note that the number of instrument errors is the inverse of the instrument error 17
  • 18. 409 12 14 16 18 20 22 24 26 28 30 32 34 36 38 1 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 (# X) Number of Instrument Errors Percentage(%)over10% GRR% Xbar&R Xbar&R Monte Carlo Simula3on in Excel. 5200 simula3ons of 10 devices. Random devices within limits Using Gage R&R (XBar&R Motorola Version) from Sta;s;cal Solu;ons Please note that 11X and greater is acceptable. However neither the Xbar&R Method nor ANOVA correctly calculate GRR at the corners of instrument limits GRR% ANOVA ANOVA Monte Carlo Simula3on in Excel. 1010 simula3ons of 10 devices. Random devices within limits 賊 4mV offset Error LSL starts at +40mV (10X) USL starts at +120mV USL-LSL starts at 80mV (10X) Anova - www.dmaictools.com/measure/grr 30.0 Percentage of simulations (Monte Carlo) that showed the instances greater than GRR 10% for each Instrument X. To read the graph, 20 on the X axis is the number of instrument errors. For GRR ANOVA, approximately 0.5% of the simulation results showed greater than a GRR of 10%. For GRR Xbar&R 1% of the simulation results showed greater than a GRR of 10%. 0 LSL USL Random samples placement 18
  • 19. 4. 10 select perfect samples to cause worst case within center 賊50% of perfect samples placement NOTE: solid line on graph of next slide 1. ANOVA 5.15 Standard deviations 2.Xbar&R 5.15 Standard deviations Lower Specification limits started at 40mV (10X), Upper Specification limit start at 120mV (10X), ranging to 40X instrument errors. This means that the difference between USL-LSL, ranged from 10X and following. Calculations were done for a process distribution width of 5.15 (encloses the central 99% of the process distribution) at worst case values.. 0 LSL USL 賊50% of perfect samples placement Please note that the number of instrument errors is the inverse of the instrument error 19
  • 20. 4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 0.1 0.035 0.04 0.045 0.05 0.055 0.06 0.065 0.07 0.075 0.08 0.085 0.09 0.095 # Instrument Errors GRR ANOVA 賊50% of perfect sample placement ANOVA 賊100% of perfect sample placement 10 Perfectly Measured Device Samples for Quali鍖ca:on, 1 tester 0 o鍖set, 1 tester +o鍖set, 1 tester - o鍖set ANOVA 賊150% of perfect sample placement ANOVA 賊200% of perfect sample placement Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 ANOVA perfect sample placement Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Note: % numbers shown are range percent error E鍖ect of Only Device Speci鍖ca:on and Sample Placement on GRR All Device Measurements Perfect 賊50% perfect sample placement 20
  • 21. Next slide contains ANOVA 1. 10 perfect samples 2. 10 perfect samples 賊50% 3. 10 perfect samples 賊100% 4. 10 perfect samples 賊150% 5. 10 perfect samples 賊200% 21
  • 22. 4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 0.1 0.035 0.04 0.045 0.05 0.055 0.06 0.065 0.07 0.075 0.08 0.085 0.09 0.095 # Instrument Errors GRR ANOVA 賊50% of perfect sample placement ANOVA 賊100% of perfect sample placement 10 Perfectly Measured Device Samples for Quali鍖ca:on, 1 tester 0 o鍖set, 1 tester +o鍖set, 1 tester - o鍖set ANOVA 賊150% of perfect sample placement ANOVA 賊200% of perfect sample placement Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 ANOVA perfect sample placement Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Note: % numbers shown are range percent error E鍖ect of Only Device Speci鍖ca:on and Sample Placement on GRR All Device Measurements Perfect 22
  • 23. Next 4 slides using ANOVA show how to use 23
  • 24. 4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 0.1 0.035 0.04 0.045 0.05 0.055 0.06 0.065 0.07 0.075 0.08 0.085 0.09 0.095 # Instrument Errors GRR ANOVA 賊50% of perfect sample placement ANOVA 賊100% of perfect sample placement 10 Perfectly Measured Device Samples for Quali鍖ca:on, 1 tester 0 o鍖set, 1 tester +o鍖set, 1 tester - o鍖set ANOVA 賊150% of perfect sample placement ANOVA 賊200% of perfect sample placement Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 ANOVA perfect sample placement Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Note: % numbers shown are range percent error E鍖ect of Only Device Speci鍖ca:on and Sample Placement on GRR All Device Measurements Perfect Have to choose something LESS than 10%. Need room for repeatability 24
  • 25. 4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 0.1 0.035 0.04 0.045 0.05 0.055 0.06 0.065 0.07 0.075 0.08 0.085 0.09 0.095 # Instrument Errors GRR ANOVA 賊50% of perfect sample placement ANOVA 賊100% of perfect sample placement 10 Perfectly Measured Device Samples for Quali鍖ca:on, 1 tester 0 o鍖set, 1 tester +o鍖set, 1 tester - o鍖set ANOVA 賊150% of perfect sample placement ANOVA 賊200% of perfect sample placement Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 ANOVA perfect sample placement Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Note: % numbers shown are range percent error E鍖ect of Only Device Speci鍖ca:on and Sample Placement on GRR All Device Measurements Perfect Choose 24 Instrument Errors (4.17%) 25
  • 26. 4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 0.1 0.035 0.04 0.045 0.05 0.055 0.06 0.065 0.07 0.075 0.08 0.085 0.09 0.095 # Instrument Errors GRR ANOVA 賊50% of perfect sample placement ANOVA 賊100% of perfect sample placement 10 Perfectly Measured Device Samples for Quali鍖ca:on, 1 tester 0 o鍖set, 1 tester +o鍖set, 1 tester - o鍖set ANOVA 賊150% of perfect sample placement ANOVA 賊200% of perfect sample placement Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 ANOVA perfect sample placement Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Note: % numbers shown are range percent error E鍖ect of Only Device Speci鍖ca:on and Sample Placement on GRR All Device Measurements Perfect If sample selection process is more or less evenly distributed then error caused by instrument specification will result in 6.6 - 7.9% GRR leaving plenty of room for repeatability to achieve final goal of 10% GRR 26
  • 27. Next slide contains Xbar&R Xbar&R is more stringent than ANOVA 1. 10 perfect samples 2. 10 perfect samples 賊50% 3. 10 perfect samples 賊100% 4. 10 perfect samples 賊150% 5. 10 perfect samples 賊200% 27
  • 28. 4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 0.1 0.035 0.04 0.045 0.05 0.055 0.06 0.065 0.07 0.075 0.08 0.085 0.09 0.095 # Instrument Errors GRR Xbar&R 賊50% of perfect sample placement Xbar&R 賊100% of perfect sample placement 10 Perfectly Measured Device Samples for Quali鍖ca:on, 1 tester 0 o鍖set, 1 tester +o鍖set, 1 tester - o鍖set Xbar&R 賊150% of perfect sample placement Xbar&R 賊200% of perfect sample placement Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 Xbar&R perfect sample placement Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) Note: % numbers shown are range percent error E鍖ect of Only Device Speci鍖ca:on and Sample Placement on GRR All Device Measurements Perfect Note: Xbar&R is more stringent to pass. Choose 25 instrument errors 28
  • 29. 4816 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 0.1 0.035 0.04 0.045 0.05 0.055 0.06 0.065 0.07 0.075 0.08 0.085 0.09 0.095 # Instrument Errors GRR Xbar&R 賊50% of perfect sample placement Xbar&R 賊100% of perfect sample placement 10 Perfectly Measured Device Samples for Quali鍖ca:on, 1 tester 0 o鍖set, 1 tester +o鍖set, 1 tester - o鍖set Xbar&R 賊150% of perfect sample placement Xbar&R 賊200% of perfect sample placement Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016息 Van Brollini 2016 息 Van Brollini 2016 息 Van Brollini 2016 Xbar&R perfect sample placement Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) Note: % numbers shown are range percent error E鍖ect of Only Device Speci鍖ca:on and Sample Placement on GRR All Device Measurements Perfect 29
  • 30. For 9% GRR the correct choices for allowable instrument error to achieve the desired 10% GRR with the 1% selection for repeatability are: Primary conclusion: Initial boundary condition is NOT SUFFICIENT to pass GRR at all!! Perfect parts and ONLY instrument error use 5.43% to 6.06% of the GRR 10% Goal Perfect parts and ONLY instrument error use 2.7% to 3.02% of the GRR 5% Goal Perfect parts, ONLY instrument and Sample Placement variation error use 4.22% to 5.62% of the GRR 10% Goal Perfect parts, ONLY instrument and Sample Placement variation error use 2.09% to 2.80% of the GRR 5% Goal Sample placement accounts for up to 1.3% of GRR 10% Goal for ANOVA Sample placement accounts for up to 0.63% of GRR 10% Goal for XBAR&R Anova Perfect 16.5 (6.06%) Anova 賊50 17.8 (5.62%) Anova 賊100 19.3 (5.18%) Anova 賊150 21.0 (4.76%) Anova 賊200 22.9 (4.37%) Xbar Perfect 18.4 (5.43%) Xbar 賊50 19.5 (5.13%) Xbar 賊100 20.7 (4.83%) Xbar 賊150 22.0 (4.55%) Xbar 賊200 23.7 (4.22%) Xbar Perfect 37.1 (2.70%) Xbar 賊50 39.3 (2.54%) Xbar 賊100 41.7 (2.40%) Xbar 賊150 44.4 (2.25%) Xbar 賊200 47.8 (2.09%) Anova Perfect 33.1 (3.02%) Anova 賊50 35.7 (2.80%) Anova 賊100 38.8 (2.58%) Anova 賊150 42.2 (2.37%) Anova 賊200 46.1 (2.17%) 9% GRR Target 4.5% GRR Target 30