48. 48
Microscopic Examination
Basic concepts of Microscopy
It is necessary to examine the structural elements and defects <->
properties of materials
Structure:
Macrostructure elements are large enough to be observed with the
unaided eye (~ mm)
Microscopic dimensions on the order of microns (100s m - ~ms )
and their details must be investigated using some type of
microscope - > Microstructure (grain size and shape)
Microscopy - Microscope: Optical, electron (SEM, TEM), and
scanning probe
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Microscopic Examination
Optical Microscopy
Base on the light reflection to study the microstructure
Contrasts in the image produced result from differences
in reflectivity of the various regions of the microstructure
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Microscopic Examination
Observation: microstructure of metals and alloys
Photomicrograph of the surface of a polished and etched
polycrystalline specimen of an ironchromium alloy in which the
grain boundaries appear dark, X100.
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Microscopic Examination
Electron Microscopy
Some structural elements are too fine to permit
observation using optical microscopy
Using beams of electrons instead of light radiation
Magnification: optical microscope 2000 X vs. electron
microscope 1.000.000 X (~ nm)
Combination of Observation and Analysis
Transmission beam modes (transmission electron
microscope - TEM) and reflection beam modes (scanning
electron microscope - SEM)
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Microscopic Examination
Scanning electron microscope (SEM): Magnifications: 10 to 50,000 X
Base on the second electron and backscattered electron reflection to
observe and analyze (EDS) the microstructure.