The document announces the 12th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging to be held from September 14-19, 2014 in Villard de Lans, France. The conference will cover topics such as x-ray diffraction imaging techniques, phase contrast imaging, standing wave techniques, microdiffraction, reflectometry, and coherent imaging. It will also discuss applications to materials science, nanoscience, biomedicine, and non-destructive testing, as well as instrumentation developments. The organizing committee is listed and important dates for abstract submission and registration are provided.
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XTOP 2014
1. 12th
Biennial Conference
on High-Resolution X-Ray Diffractionand Imaging
14th
- 19th
September 2014Villard de Lans, France
http://xtop2014.org
Methods & TechniquesX-ray diffraction imaging (topography)
Phase contrast imagingStanding wave technique
High resolution XRDMicrodiffractionGrazing Incidence diffraction
X-ray reflectometry, SAXS/GISAXS
Time resolved diffraction
Coherent imagingResonant (anomalous) scattering
Fast tomographyTheory of X-ray diffraction in crystalsApplicationsMaterial science (single crystals, heterostructures, surface
and interfaces)Nanomaterials/Nanoscience
BiomedicalNon-destructive testing (including industrial needs
and cultural heritage)
InstrumentsX-ray optics and instrumentation
New developments for lab. diffractometry
X-ray Free-Electron Lasers