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Singapore Singapore

Application Specialist at ZEISS Microscopy

Electronics / Computer Hardware

Highly experienced in advanced TEM, SEM and FIB techniques. Key Specialties: •Transmission Electron Microscopy (TEM) (Aberration-Corrected TEM, Tomography, Holography, EELS, STEM, etc) •Scanning Electron Microscope(SEM) •Focused Ion Beam (FIB) •Failure Analysis (FA) •Technical application training •Scientific Research •Computer programing (Matlab and C) •Semiconductor, Wafer Fabrication •Trained on SPC, DOE