This document outlines Robert Morien's work during the 2004 REU program to design an improved x-ray diffractometer under the supervision of Prof. Paul Lyman. It provides background on x-ray diffraction and how it is used to analyze semiconductor wafers and determine molecular structures. It describes different types of x-ray diffractometers including 2-circle, 4-circle, and kappa configurations. It also includes the diffraction pattern Robert obtained from analyzing a silicon powder sample and discusses plans to use the diffractometer to analyze pentacene crystals grown at UWM for potential use in organic electronics.