Davide Trapani is an Italian national born in 1976 in Catania, Italy. He received a degree in Physics of Materials from the University of Catania in 2002 with a thesis on the formation of TiSi2 in amorphized silicon. Since 2003, he has worked at STMicroelectronics in Catania as a Product Division Quality Section Manager. In this role, he analyzes customer complaints, manages failure analysis, and ensures product quality and conformity to specifications. He has expertise in failure analysis techniques including TEM, SEM, XRF, SIMS, and electrical measurements.